XRF Analysis Services
Ellington & Associates, Inc. provides sample analysis using x-ray fluorescence (XRF) spectrometry.
X-Ray Fluorescence (XRF)
X-Ray Fluorescence (XRF) analyzers can quickly and nondestructively determine the elemental composition of:
Metal and precious metal samples
Rocks, ore, and soil
Painted surfaces, including wood, concrete, plaster, drywall, and other building materials
Plastics, consumer goods
Dust collected on wipe samples
Airborne heavy elements collected on filters
Up to 40 elements may be analyzed simultaneously by measuring the characteristic fluorescence x-rays emitted by a sample. XRF analyzers can quantify elements ranging from sodium (Na - element 11) through uranium (U - element 92).
How does XRF work?
Each of the elements present in a sample produces a unique set of characteristic x-rays that is a "fingerprint" for that specific element. XRF analyzers determine the chemistry of a sample by measuring the spectrum of the characteristic x-ray emitted by the different elements in the sample when it is illuminated by x-rays. These x-rays are emitted either from an x-ray tube.
A fluorescent x-ray is created when an x-ray of sufficient energy strikes an atom in the sample, dislodging an electron from one of the atom's inner orbital shells.
The atom regains stability, filling the vacancy left in the inner orbital shell with an electron from one of the atom's higher energy orbital shells.
The electron drops to the lower energy state by releasing a fluorescent x-ray, and the energy of this x-ray is equal to the specific difference in energy between two quantum states of the electron.
When a sample is measured using XRF, each element present in the sample emits its own unique fluorescent x-ray energy spectrum. By simultaneously measuring the fluorescent x-rays emitted by the different elements in the sample, the instrument can determine those elements present in the sample and their relative concentrations - in other words, the elemental chemistry of the sample. For samples with specifically defined chemical composition, such as common grades of metal alloys, these XRF instruments also identify most sample types by name, typically in seconds.
SPECTRO XEPOS Field Portable XRF
The SPECTRO XEPOS is a versatile XRF spectrometer for demanding applications. Optimum excitation using polarization and secondary targets, an autosampler for up to 12 items and intelligent software modules, deliver higher sensitivity and accuracy for the entire element range from Na-U and make the SPECTRO XEPOS one of the most versatile element analyzer available.
Hand Held XRF for Portable Elemental Analysis
High Resolution Analysis on Cores
Centimeter-scale analysis on cores with a small spot-size
On board camera allows targeting for ultra-precision
Analyze filled veins, vugs, and fractures
Analysis at the Outcrop Characterization – Reconnaissance – Exploration – Confirmation Is your shale calcareous or siliceous? In situ analysis in less than 1 minute! An ultra-portable device brings elemental analysis to the outcrop
Contact Ellington and Associates, Inc. today for more information about XRF analysis services 713-956-2838.